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  • Hologenix Slip Finder Hologenix Slip Finder Hologenix Slip Finder for slip line and dislocation defect detection in wafers and epi layers
  • Hologenix NGS Hologenix NGS Hologenix NGS automated defect detection microscope, CD and Overlay measurements
  • E+H Metrology's E+H Metrology's E+H Metrology's Geometry and Resistivity high-througput wafer sorter
  • E+H Metrology's wafer Geometry E+H Metrology's wafer Geometry E+H Metrology's wafer Geometry (thickness, bow, warp, flatness, stress) table-top gauge
  • Yamashita Denso Yamashita Denso Yamashita Denso Large Area Long Pulse Class AAA Solar Simulators
  • SemiMap Scientific COREMA SemiMap Scientific COREMA SemiMap Scientific COREMA for contactless resistivity measurements and high resolution mapping of semi-insulating wafers
  • Hologenix Magic Mirror™ Hologenix Magic Mirror™ Wafer inspection and defect detection on polished and epi wafers
  • ARDIC M-150 MEMS ARDIC M-150 MEMS ARDIC M-150 MEMS analyzer for characterizing microstructural mechanical properties
  • ISIS SemDex ISIS SemDex ISIS SemDex multi-layer thickness measurements and 3D wafer flatness, roughness and bow measurements

     

A DIVERSIFIED INTERNATIONAL TECHNOLOGY COMPANY

SALES AND SERVICE OF EQUIPMENT AND SOFTWARE FOR PROCESS
DEVELOPMENT AND ADVANCED MANUFACTURING

Industries:
Semiconductor, Disk Drive, MEMS, LED, PV, Photonics,
Nanotechnology, Biomedical, Microelectronics

Applications:
Dimensional Metrology, Surface Inspection, Defect Detection,
UV Curing & Exposure, LED Illumination, Solar Simulation