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| Hologenix
offers a wide range of advanced wafer characterization and measurement
equipment. In 1988, the Hologenix Magic Mirror™ surface inspection
method received the Semiconductor International Technology Achievement
Award for QC/QA & Testing. Since then, Hologenix has successfully
introduced several inspection and analysis systems providing innovative
solutions for diverse applications.
Hologenix helps customers meet advanced process inspection needs requiring unsurpassed sensitivity. We offer high-throughput production inspection machines to in-depth materials analysis instruments including: |
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