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| Hologenix
offers a wide range of advanced wafer characterization and measurement
equipment. In 1988, the Hologenix Magic Mirror surface inspection
method received the Semiconductor International Technology Achievement
Award for QC/QA & Testing. Since then, Hologenix has successfully
introduced several inspection and analysis systems providing innovative
solutions for diverse applications.
Hologenix helps
customers meet advanced process inspection needs requiring unsurpassed
sensitivity. We offer high-throughput production inspection machines
to in-depth materials analysis instruments including:
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- Wafer Geometry,
Thickness and Resistivity Gauges
- Surface and
Edge Inspection Defect Detection Systems
- Semi-Insulating
Materials Analysis
- Visualization
and Analysis Software
- Optical Microscopy
and Automated Defect Detection
- High Resolution Surface Topography,
Wafer and Layer Thickness, Flatness Measurements
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