HOLOGENIX


	Innovative Products and Technology for Inspection, Metrology, and Materials Processing for Semiconductor, Solar, MEMS, Biotech, Optics, Industrial, Photonics, LED, and Microelectronics industries.



Metrology		Defect Detection/Inspection
Wafer Geometry(thickness/ flatness/ bow/ warp), Resistivity, Stress and Type Measurements Resistivity Mapping for Semi-Insulating SiC, GaAs, InP & GaN 3D Surface Metrology and Wavefront Sensing		Defect Detection/Inspection
			Crystal Slip Defect Detection Defect Detection on Ultra-Flat Wafers Microscope Defect Detection System Wafer Edge Inspection
		Other
Software		Other
Software
Visualization and Analysis Software Yield and Test Analysis Software
			LED Illumination UV Curing and Exposure systems, Solar Simulation Systems UV Lamps Subsurface - Surface defect detection and characterization