HOLOGENIX


		Innovative Products and Technology for Inspection, Metrology, and Materials Processing

	Hologenix provides advanced metrology and inspection equipment for various industries including Semiconductor, Solar, MEMS, Biotech, Optics, Industrial, Photonics, LED, and Microelectronics. We have a large and diverse customer base using our innovative technologies worldwide for numerous applications.

Metrology			Defect Detection/ Surface Inspection
Wafer Geometry(thickness/ flatness/ bow/ warp), Resistivity, Stress and Type Measurements Resistivity Mapping for Semi-Insulating SiC, GaAs, InP & GaN 3D Surface Metrology and Wavefront Sensing			Defect Detection/ Surface Inspection
				Crystal Slip Defect Detection Defect Detection on Ultra-Flat Wafers Microscope Defect Detection System Wafer Edge Inspection
			Other
Software			Other
Software
Visualization and Analysis Software Yield and Test Analysis Software
				LED Illumination UV Curing and Exposure systems, Solar Simulation Systems UV Lamps Subsurface - Surface defect detection and characterization