Visit us at SEMICON WEST 2008 !
July 15, 16, 17
San Francisco, CA, USA - North Hall, booth 5447

Hologenix to Display Updated Automated Microscope at Semicon West
NGS-3500

Hologenix Delivers High Throughput Thickness/Geometry Sorters for 300mm Wafer Reclaim
E+H 300mm Wafer Charachterization Tools

Hologenix Delivers 300mm NGS Automated Microscope for SOI Application
NGS-3500

Hologenix Delivers 300mm NED Edge Inspector to Equipment Manufacturers
NED Edge Inspector

Hologenix Offers New COREMA Resisitivity and Mobility Measurement Systems for SiC and other Compound Semiconductor Materials
COREMA