PRODUCTS
	Metrology
	MX Series Gauges by Eichhorn+Hausmann Wafer Geometry and Resistivity Gauges Compact table top tools and automated wafer sorters for thickness, warp, bow, and flatness.
	COREMA by SemiMap COntactless REsistivity MApping Measurement System High-resolution measurements of semi-insulating GaAs, InP and SiC materials.
	SemDex by ISIS optronics Contactless Layer Inspection and Metrology Measurement Contactless spatial thickness and surface mapping of ultra-thin wafers, MEMS and bumps.
	Defect Detection / Surface Inspection
	Magic Mirror™ by Hologenix Wafer Surface Inspection System Full field wafer view defect detection system.
	SlipFinder™ by Hologenix Crystal Slip Detection System Fully-Automated inspection system using advanced slip detection software
	NGS-3500 by Hologenix Microscope Defect Detection System Automated microscope detects Slip Dislocation and other defects occuring during many wafer processes.
	Wafer Edge Inspector by NED Wafer Edge Defect Detection Automated defect detection system using linescan machine vision.
	Software
	WAFERMAP by BOIN Analytical and Visualization Software Collect, edit, analyze and visualize measured physical parameters on semiconductor wafers.
	yieldWerx Semiconductor Data Analysis Software yieldWerx provides users with a wide variety of statistical analysis charts and reports, all integrated with the yieldWerx database.
	Other
	Hypercure by Hologenix Ultra Violet Curing System, Light Sources and Exposure Systems State-of-the-art system cures material without heat but with strong UV energy.
	Lamps Replacement Lamps High Pressure Xenon, Mercury and Flash Lamps.
	. PBS® and EPBS™ by VTI® Surface and Subsurface Defect Measurement Systems Full wafer mapping and measurements of microdefects on and below (< = 3µm) the wafer surface.