Editors'
Choice Best Product Award
Presented to Boin GmbH
for Semiconductor Manufacturing Excellence
Presented to Boin GmbH
for Semiconductor Manufacturing Excellence
| WAFERMAP | ||||||||||||||
| By BOIN | ||||||||||||||
| WAFERMAP is an award winning software package used to collect, edit, analyze and visualize measured physical parameters on semiconductor wafers. WAFERMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, different 2D or 3D plots or as a histogram. The new release 2.14 runs under Microsoft Windows 95, 98, NT, 2000, XP and Vista. This release adds a number of important new functions and capabilities to the software. | ||||||||||||||
| Hologenix is the exclusive distributor of WAFERMAP in the United States and Canada | ||||||||||||||
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Editors'
Choice Best Product Award
Presented to Boin GmbH for Semiconductor Manufacturing Excellence |
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