At the end of each test, the binning gives information about which devices have passed and which ones have failed.
The Bin Pareto Charts give a clear view about how the devices binned.
| Wafer Mapping | ||||||
| Hardware and Software Bins | Test Results Mapping by Inter Quartile Range | |||||
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| Create customized statistical reports with yieldPower | ||
| yieldPower
provides a quick and easy toolbox for statistical analysis of ATE
data. Once the analysis is done, it is important to create a customized
report of the measured data. Using the yieldPower Test Data Report Template Creator, you can add "any test from any lot" to a test report, and pull in data from the database for those tests. With yieldPower Reporting, it is possible to create both digital and printed reports. It is possible to save a report layout and use the same settings for other datasets. The Project option of yieldPower creates a user-friendly environment with predefined tables and graphs of actual raw data. |
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| Histograms | ||||
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| Multiple Histograms | ||||
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| Use yieldPower to create up to 12 different test result histograms from twelve different lots. | ||||
yieldPower bridges
the gaps between raw test data, statistical reports and SPC analysis.
The power and advantages of yieldPower are its speed, simplicity
and efficiency.
It brings 'real time' statistical analysis directly to the test floor.
With yieldPower, test engineers and production engineers have better tools for process analysis, process control and quality improvement.