|
|
|
|
|
|
|
|
|
|
|
| yieldPower |
|
|
|
|
|
|
|
|
|
|
|
|
|
 |
|
| Overview |
|
|
|
|
|
|
|
|
|
|
yieldPower is a desktop-based multi-user application aimed
at improving yield management and data analysis capabilities of
both fabs and fabless semiconductor firms. The system is built with
Microsoft.Net Technology, and is capable of processing large amounts
of test data and performing complex statistical analysis.
|
|
|
|
|
|
|
 |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
Minimum system
configurations required to run yieldPower are Windows 2000
with the latest service pack, Windows XP, IE 5.01 or higher and
Microsoft Excel.
|
|
|
|
|
|
|
|
|
|
|
|
|
 |
|
|
| The
yieldPower database directly imports semiconductor test data
in STDF or ATDF format and runs statistical analysis on it, and automatically
defines outliers from within test results. Data is available to users
for viewing, and for editing. yieldPower's characterization
tools evaluate parameters based on lot splits, voltage, temperature,
wafer, stored parametric statistics, single and multidimensional condition
analysis, etc. |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
 |
|
Statistics
Once
the data is in yieldPower, users have powerful functionality
at their fingertips.
A yieldPower user has the ability to drill down to each
test parameter, and do a die by die view of results, observe
and edit outliers and recalculate results based on changes or
exclusions made. Statistics calculated per test parameter are
Mean, Standard Deviation, Min, Max, Cpk, Yield, etc. |
|
|
|
Report
Templates
The most
powerful feature in yieldPower is the ability to make
Test Report Templates. Users can define templates for reports,
with sections and sub-sections. |
|
|
Test
Data Report (TDR)
Once a template
has been created, it can be reused in multiple reports.
When creating a Test Data Report (TDR), device characterization
information, specifications and sim performance need to be added.
This allows characterizing a test with the intended specifications.
The next step is to link the sub-sections with actual data from
the lots.
Once the test parameters are linked to a TDR, it can be reused
over and over again.
All reports and graphs are exportable to HTML format for distribution
over e-mail or the web. |
|
|
|
|
|
|
|
|
Charting
The imported data
can be visualized as Box Plots, Correlation Plots, X/Y Scatter Plots,
single and multiple Histograms, Wafer Maps or Pareto Diagrams.
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
yieldPower
provides semiconductor companies with the essential tool needed
to analyze production data, manage yield, and share data with anyone
all over the world.
|
|
|
|
|
|
|
|
|
|
Back |
|
|
|
|
|
|
|
|
|
|
|
|
|
|