General

WAFERMAP-View.OCX for Windows is a software development kit for the semiconductor industry. It offers the 7 different types of plots included in WAFERMAP for Windows as an ActiveX control.

WAFERMAP-View.OCX employs an innovative object oriented visual programming interface to create and modify wafer plots. It was developed to satisfy the analysis and visualization needs of metrology equipment manufacturers.
WAFERMAP-View.OCX allows software developers to use BOIN's innovative techniques to develop their own data analysis and visualization tools. 1D, 2D, 3D graphs and histograms can easily be integrated into existing applications. The product complies to the activeX standard and has an easy to use programming interface. Example source code in Visual Basic as well as online help are included.
OEM customers can benefit from WAFERMAP-View.OCX because they can quickly and easily integrate WAFERMAP's capabilities into their own metrology applications. Because of it's extensive data visualization capabilities,, WAFERMAP-View.OCX is the perfect solution for manufacturers of ellipsometers, four point probes and other metrology equipment.

Features

- 1D, 2D Contour, 2D Color, 3D Color Plots
- 2D Sigma range, 3D Sigma Range, Histogram Plots
- Histogram Plots
- Easy to use programming interface
- Sophisticated property pages
- Complies to ActiveX Standard
- Example source code in Visual Basic 6.0
- On line help